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Karl Palsson 664701d7a7 gadget-zero: ti: use correct part name 3 years ago
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.gitignore tests: usb-gadget0: gitignore generated linker scripts 6 years ago
70-libopencm3.rules tests: gadget0: include sample udev rules and document 7 years ago
Jenkinsfile jenkins: try no parallelism 4 years ago
Makefile gadget0: allow parallel submake 5 years ago
Makefile.efm32hg309-generic tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32f3-disco tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32f4disco tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32f072disco tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32f103-generic tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32f429i-disco tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32l1-generic tests: gadget0: switch to Linker script generation 4 years ago
Makefile.stm32l053disco tests: gadget0: switch to Linker script generation 4 years ago
Makefile.tilm4f120xl gadget-zero: ti: use correct part name 3 years ago
README.md tests: gadget-zero: add xunit reporting 4 years ago
delay.c tests/gadget0: avoid floating point division 5 years ago
delay.h tests: gadget0: delay between calls to trigger races 8 years ago
delay_efm32.c tests: gadget0: efm32hg: add gadget0 test for efm32hg 7 years ago
main-efm32hg309-generic.c tests: gadget0: efm32hg: add gadget0 test for efm32hg 7 years ago
main-stm32f3-disco.c tests: gadget0: stm32f3: use library clock setups 6 years ago
main-stm32f4disco.c gadget0: f4: update to newest rcc api 5 years ago
main-stm32f072disco.c tests: gadget0: delay between calls to trigger races 8 years ago
main-stm32f103-generic.c tests: stm32f1: use new clock struct routines 4 years ago
main-stm32f429i-disco.c gadget0: f429: update to newest rcc api 5 years ago
main-stm32l1-generic.c gadget0: stm32l1: target the "hw1" test board explicitly 7 years ago
main-stm32l053disco.c tests: gadget0: delay between calls to trigger races 8 years ago
main-tilm4f120xl.c tests: usb gadget0: ti: use dummy delay handlers 6 years ago
openocd.common.cfg tests: extract serials to optional local config 9 years ago
openocd.efm32hg309-generic.cfg tests: gadget0: efm32hg: add gadget0 test for efm32hg 7 years ago
openocd.stm32f3-disco.cfg tests: gadget0-f3: allow custom local stlink 4 years ago
openocd.stm32f4disco.cfg tests: extract serials to optional local config 9 years ago
openocd.stm32f072disco.cfg tests: extract serials to optional local config 9 years ago
openocd.stm32f103-generic.cfg tests: extract serials to optional local config 9 years ago
openocd.stm32f429i-disco.cfg tests: extract serials to optional local config 9 years ago
openocd.stm32l1-generic.cfg tests: extract serials to optional local config 9 years ago
openocd.stm32l053disco.cfg tests: extract serials to optional local config 9 years ago
stub.py tests: usb: gadget0 compatible interface (stm32f4) 9 years ago
test_gadget0.py trya nd make directories per 4 years ago
usb-gadget0.c usb gadget0: ctrl write/read loopback tests 6 years ago
usb-gadget0.h tests: gadget0: delay between calls to trigger races 8 years ago

README.md

This project, inspired by usbtest and the linux usb gadget zero driver is used for regression testing changes to the libopencm3 usb stack.

The firmware itself is meant to be portable to any supported hardware, and then identical unit test code is run against all platforms. This project can and should be built for multiple devices.

Requirements:

  • pyusb for running the tests.
  • OpenOCD >= 0.9 for automated flashing of specific boards
  • python3 for running the tests at the command line.
  • unittest-xml-reporting, only if running in CI mode. XX

Building the device firmware

There are Makefile.xxxxx files for all the currently tested targets.

make -f Makefile.stm32f4disco clean all V=1

The V=1 is optional, and turns on verbose mode, which can be useful if things don't work. This will give you a .elf file you can program using your own toolchain, but if you have a functional OpenOCD installed, then...

make -f Makefile.stm32f4disco clean all flash

Will handle flashing as well.

Setting up the test runner (using python virtual environments)

pyvenv .env  # ensures a python3 virtual env
. .env/bin/activate
pip install pyusb

If you have multiple test boards connected, have a look at opencd.common.cfg for some tips on selectively matching the right board. For people with just a single matching board, you don't need to do anything.

Tests marked as @unittest.skip are either for functionality that is known to be broken, and are awaiting code fixes, or are long running performance tests

Access rights

On some systems (most linux systems) you probably won't have access to the usb vendor id being used/hijacked by the test cases. See 70-libopencm3.rules for installation instructions, or, if you have your own system, grant yourself access to the usb vid: 0xcafe

Running the tests

Below is an example of running the full suite of tests from the command line. The argument specifies the serial number to look for in the usb gadget, if you have more than one. No argument will the tests against all gadget-zero's found.

$ python test_gadget0.py
Running tests for DUT:  stm32f072disco
.........ss................
----------------------------------------------------------------------
Ran 27 tests in 0.388s

OK (skipped=2)

To be even more brutal, run this in a shell loop.

$ while true; do python test_gadget0.py -d stm32f072disco; done

You can also run individual tests, or individual sets of tests, see the unittest documentation for more information.

Many development environments, such as PyCharm can also be used to edit and run the tests, in whole or individually, with a nice visual test runner.